SFM: Microscopia a scansione di forza

A brief introduction to scanning probe microscopes and electron scanning microscopes is followed by a description of the scanning force microscope operating principle, of its performance and limits; some SFM images of semiconductor samples are shown as examples of the potentialities of this technique.

Numero: Anno XXX - n.3 - luglio/settembre 1997

Categoria articolo: Cultura

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